R&D Magazine selected Bruker AXS's x-ray detector as one of the most technologically significant products introduced into the marketplace during the past year.
"Since its introduction, the VANTEC-2000 has dramatically boosted the performance of X-ray diffraction (XRD) detectors for materials research. It combines low noise, high sensitivity, excellent spatial resolution and dynamic range with real-time data acquisition," explained Product Manager Uwe Preckwinkel.
The system measures the two-dimensional X-ray diffraction pattern from a sample, allowing for the calculation of a wide variety of physical parameters in a broad range of sample types.
Because of its ability to detect individual photons at up to two million counts per second, the detector is ideal for the analysis of scattering samples, including smallest sample traces, single crystals, epitaxial thin films, coatings, rocks, polymers, metals, steel, wood, plastics, liquids, and nanomaterials.
The award "provides a mark of excellence known to industry, government, and academia as proof that the product is one of the most innovative ideas of the year," explained Editor-in-Chief Tim Studt.
Bruker AXS provides advanced X-ray solutions for life and advanced materials sciences.