Yenra : Electronics : OSPA : Optical S-Parameter Analyzer : Passive Optical Device Characterization Market

FiberWork has developed and is commercially releasing the OSPA (Optical S-Parameter Analyzer).

The OSPA is a fast platform for full and accurate characterization of passive optical devices during R&D and production, such as Fiber Bragg Gratings, interference filters, AWG's, dispersion compensators, optical multiplexors and demultiplexers, short lengths of fiber, and photonic crystal fiber devices.

It fully characterizes passive optical devices, providing simultaneously essential parameters such as phase, time delay, chromatic dispersion, reflectivity, transmissivity, bandwidth, insertion loss, return loss, polarization dependent loss and polarization mode dispersion (PMD/DGD). It replaces alternative solutions which requires several instruments and that can not measure all parameters simultaneously. It is intended towards time and cost savings during device development, production, testing and qualification stages.

The OSPA technology is built around an original interferometric technique. Such an innovation has been awarded with the British "Metrology for World Class Manufacturing Award" under category "Frontier Science and Measurement - Innovation in Metrology and Measurement Standards for Industry and Research".

Bearing a long list of technical advantages as compared to its competing technologies, the OSPA also innovates by treating the device under test using "optical S-parameter theory", an important innovation for multi-port device characterization. OSPA's differentials include theoretical curve fitting routines, which allow to find DUT parameters non-directly measured; external laser solution; compatibility with main commercially available tunable laser sources allowing cost effective integration with existing equipment; swept and stepped wavelength operation modes; S, C and L wavelength operation bands; easy and friendly Windows based user interface; fully automated operation; temperature and vibration stability; reduced space; simultaneous measurement in transmission and reflection in a single scan, integrated optical bench for ease of use and capability to characterizing multi-port devices.