WAFER IDENTIFICATION: VALIDATE READS AND TRACEABILITY
Editable planning/verification record — Yenra
Updated: October 2, 2026
Article: https://yenra.com/wafer-reader/

Purpose: Design a representative read-validation set and specify what the host must do with each outcome.
Intended reader: Fab automation and quality engineers evaluating wafer identification.

HOW TO USE
Save a working copy. Enter the actual specification, units, assumptions and evidence references in each field. Preserve original observations and record changes. Have the responsible reviewer resolve missing or conflicting requirements before release. Examples below are fictional teaching inputs, not process settings or acceptance standards.

RECORD
1. Wafer/lot identifier and independently established expected identity:
   ____________________________________________________________

2. Mark format and applicable standard revision:
   ____________________________________________________________

3. Reader, optics, working distance in mm, lighting and recipe version:
   ____________________________________________________________

4. Process stage, mark appearance and representative variation:
   ____________________________________________________________

5. Trigger/transaction ID, decoded string, confidence/status and image reference:
   ____________________________________________________________

6. Correct reads, wrong identities and no-reads, with attempted-read denominator:
   ____________________________________________________________

7. Host matching, duplicate handling, timeout and stale-result tests:
   ____________________________________________________________

8. Manual recovery authorization, evidence, original result and disposition:
   ____________________________________________________________


WORKED EXAMPLE AND LIMITS
Fictional validation: 1000 attempts yield 990 correct identities, 2 wrong identities and 8 no-reads. Decode yield is 992/1000 = 99.2%; correct identification is 990/1000 = 99.0%; wrong identities are 0.2% and no-reads 0.8%. These are observed sample rates. A high decode rate can conceal consequential wrong identities.

REVIEW
Prepared by / date: ____________________
Reviewed by / date: ____________________
Open issues, responsible owner, due date: ____________________
Approved next action and evidence: ____________________

SOURCE CONTEXT
These primary references support the linked article. Use exact applicable product, contract, and document versions for operational work.
Cognex In-Sight 1750 overview
https://docs.cognex.com/wafer_2620/web/EN/175x_Manual/Content/Topics/1700_Topics/Introduction/Intro.htm
Cognex CVL guide
https://docs.cognex.com/cvl_900/EN/cvl_vision_tools_guide.pdf

Return to the guide: https://yenra.com/wafer-reader/