Wafer Tracking: Connecting Carriers, Lots, and Process History https://yenra.com/semiconductors/tracking.html Updated September 11, 2026 Purpose: Review carrier-to-material associations and event handling with manufacturing and MES engineers. This aid is not a physical handling procedure, SEMI conformance test or equipment command script. Instructions: Use a qualified test environment and synthetic identifiers. Define expected outcomes from the implemented interface specifications. Keep production material records and recipes private. Tool / port / carrier and tag type / reader model / firmware: MES or host / adapter version / implemented SEMI revisions: Carrier identity source / substrate and lot identity source: Slot-map verification source / association owner and version: Event identifier / observation time / receipt time / time synchronization: Acknowledgment / retry / duplicate handling / recovery contract: Synthetic carrier-reuse test (illustrative times, same test day): 08:00 DEMO-C17 associated with DEMO-A and verified slot map. 09:00 approved unloading closes DEMO-A association. 10:00 DEMO-C17 associated with DEMO-B under a new association version. 10:05 delayed observation from 08:00 arrives. Expected: reconcile against original DEMO-A context or raise an explicit exception if evidence is insufficient; never silently attach the old event to DEMO-B. Observed result / evidence / reviewer: Other tests: unexpected carrier; unreadable tag; duplicate event; slot-map mismatch; split/merge or transfer lineage; interface outage and recovery. For EACH: expected host/equipment behavior / actual result / evidence / owner / disposition. Cleanroom/material and physical test approvals / exact equipment documents: Acceptance boundaries / remaining uncertainty / revalidation triggers: Public scope references (use licensed specifications for implementation): https://store-us.semi.org/products/e09900-semi-e99-specification-for-carrier-id-reader-writer https://store-us.semi.org/products/e08700-semi-e87-specification-for-carrier-management-cms https://store-us.semi.org/products/e09000-semi-e90-specification-for-substrate-tracking