Radiation-tolerant FPGA evidence checklist
Yenra | Updated September 28, 2026
Guide: https://yenra.com/radiation-tolerant-fpga/

Mission / duration / orbit / shielding model / environment source:
Exact part / grade / revision / lot information where applicable:
Datasheet / radiation report / errata / issue date:
Claim type: measured, modeled, specified or assumed:
TID: dose units and material; dose rate; bias; temperature; pass criteria:
SEE: particle / energy or LET / fluence / conditions / resources exercised:
SEU: cross-section or rate? per bit or device? model and sensitive population:
SEFI: affected function / detection / recovery action:
SEL: stated limit or immunity / test scope / protection:
Critical FPGA functions / shared resources / output consequences:
Redundancy / voting / EDAC / scrubbing / watchdog implementation:
Mitigation failure modes / common dependencies:
Fault-injection coverage / radiation-test coverage / remaining gaps:
Detection time / valid-output recovery time / lost data / manual action:
Bitstream hash / tools and settings / constraints / mitigation version:
Requirement owner / evidence location / acceptance status:
Review after device, environment, design or tool changes.
Example only: 1e-10 upset/bit/day x 1e7 bits = 0.001 upset/day;
x 365 days = 0.365 expected upsets. This is not system failure probability.
Do not substitute a different device's test values for missing evidence.

Source context: This worksheet accompanies the linked guide and its primary-source references.