PORTABLE MICROSCOPE SURFACE INSPECTION RECORD
Yenra | Updated October 9, 2026
Guide: https://yenra.com/microscopes/portable.html

Use one record per object/session. Save it beside original images and an
overview/coverage sketch. This record documents observations; acceptance
decisions require an applicable method and criteria.

Object ID / date / observer:
Inspection question and boundaries:
Handling restrictions and approved contact/support:
Overview filename / orientation reference:
Coverage map or grid filename:
Instrument / lens / zoom / working distance (with unit):
Support / illumination direction and settings:
Camera mode / saved dimensions in pixels / binning:
Exposure and other acquisition settings:
Calibration reference ID / known interval and unit:
Calibration image filename / matching settings:
Verification measurement of known reference:
Repeatability observations / measurement uncertainty if established:

Repeat for each region:
Region ID / overview location:
Wide-view file / detail file / repeat file:
Observed feature and lighting dependence:
Measured interval in pixels / conversion / result with unit:
Interpretation and evidence still needed:
Coverage completed / obscured or inaccessible area:

ILLUSTRATIVE ARITHMETIC ONLY
2.00 mm / 1000 pixels = 0.002 mm/pixel.
150 pixels x 0.002 mm/pixel = 0.30 mm in a matching image.
Use your own calibration. Recheck when spatial sampling or optics change;
surface tilt, edge choice and repeatability affect the result.

Final coverage gaps / next action / reviewer:
Original-data location / processing history:
Calibration context:
https://www.leica-microsystems.com/science-lab/industrial/microscope-calibration-for-measurements-why-and-how-you-should-do-it/