Feature Extraction for Microscopic Defects 0 - Image Index | 20 Ways AI is Advancing Semiconductor Defect Detection Defect Analysis in Microscopic Sample: A microscopic view of a sample, with a prominent circular structure in the foreground. The structure is likely a defect or irregularity within the material being examined. It appears to be surrounded by a thin ring of light, which may indicate its presence or significance. The background of the image is blurry and out of focus, but it seems to feature a series of smaller, more uniform structures that are not as prominent as the central defect. The overall impression given by this image is one of scientific inquiry and analysis, suggesting that it has been captured using advanced microscopy techniques for the purpose of studying or characterizing the sample's properties.
