ELECTRON MICROSCOPY FACILITY CONSULTATION BRIEF
Yenra | Updated October 9, 2026
Guide: https://yenra.com/electron-microscope/

Complete known fields before consulting the facility. Mark unknowns explicitly.
Agree on preparation before cutting, coating, drying or submitting specimens.
Follow the facility's submission and handling requirements.

Project / contact / date:
Decision the observations should support:
Observation that would answer the question:
Specimen IDs / overview images:
Composition / substrate / dimensions with units:
Moisture / conductivity / beam sensitivity (known or unknown):
Hazardous constituents / handling or transport restrictions:
Feature size estimate with unit and basis:
Location and orientation of interest:
Comparison regions / controls / number of specimens:
Permitted preparation changes / must sample be returned intact?:

AGREE WITH THE FACILITY
Candidate method: SEM / TEM / STEM / other:
Detector or analytical signals and why they answer the question:
Preparation method / person responsible / possible artifacts:
Sampling plan / number of fields / overview-to-detail record:
Calibration and relevant acquisition settings to retain:
Original files / metadata / spectra or other analytical deliverables:
Processing and interpretation support:
Acceptance or uncertainty requirements if measurements are requested:
Training / session time / costs / next action:

REPORTING CHECK
Separate observations from interpretation. Record preparation, detector,
acquisition conditions, scale, location, processing and unresolved alternatives.
SEM, TEM and STEM overview sources are linked in the guide.