Carbon Nanotubes in Electronics: Structure, Devices and Evidence
Yenra | Updated September 17, 2026
Article: https://yenra.com/carbon-nanotubes/

CARBON NANOTUBE DEVICE EVIDENCE RECORD
Purpose: connect a material or device claim to its application.
Source URL/date and authors:
Object: single tube / aligned array / network / transistor / circuit / system
Single-wall or multiwall; diameter/chirality characterization:
Tube density, alignment, length and purity method:
Contacts, gate/dielectric and substrate:
Bias, temperature, environment and measurement duration:
Electrical result and normalization (per tube/device/width):
Optical result: excitation, spectral range, detector and sample preparation:
Sample count, distribution, failures and exclusions:
Measured result versus projection:
Manufacturing and reliability evidence still needed:

ILLUSTRATION ONLY: 10,000 tubes at 99.9% semiconducting implies about 10 unwanted tubes by population arithmetic. Placement and circuit tolerance are needed to estimate yield.
Next check and decision:

SOURCE REFERENCES
MIT’s 2019 nanotube-microprocessor report
https://news.mit.edu/2019/carbon-nanotubes-microprocessor-0828
IBM research on nanotube FETs and logic
https://research.ibm.com/publications/carbon-nanotube-field-effect-transistors-and-logic-circuits
“Simultaneous fluorescence and Raman scattering from single carbon nanotubes”
https://pubmed.ncbi.nlm.nih.gov/12958353/
original study comparing suspended and micelle-encapsulated tubes
https://arxiv.org/abs/cond-mat/0308359
MIT’s 2020 fabrication report
https://news.mit.edu/2020/carbon-nanotube-transistors-factory-0601